Can defects be fixed with weak test suites? An analysis of 50 defects from Defects4J.
http://arxiv.org/abs/1705.04149
@article{DBLP:journals/corr/JiangX17,
author = {Jiajun Jiang and
Yingfei Xiong},
title = {Can defects be fixed with weak test suites? An analysis of 50 defects
from Defects4J},
journal = {CoRR},
volume = {abs/1705.04149},
year = {2017},
url = {http://arxiv.org/abs/1705.04149},
archivePrefix = {arXiv},
eprint = {1705.04149},
timestamp = {Mon, 13 Aug 2018 16:47:11 +0200},
biburl = {https://dblp.org/rec/journals/corr/JiangX17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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