A High-Throughput and Arbitrary-Distribution Pattern Generator for the Constrained Random Verification.
https://doi.org/10.1109/TCAD.2013.2282776
@article{DBLP:journals/tcad/WuYH14,
author = {Bo{-}Han Wu and
Chun{-}Ju Yang and
Chung{-}Yang Huang},
title = {A High-Throughput and Arbitrary-Distribution Pattern Generator for
the Constrained Random Verification},
journal = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
volume = {33},
number = {1},
pages = {139--152},
year = {2014},
url = {https://doi.org/10.1109/TCAD.2013.2282776},
doi = {10.1109/TCAD.2013.2282776},
timestamp = {Sat, 20 May 2017 00:23:53 +0200},
biburl = {https://dblp.org/rec/journals/tcad/WuYH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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